学術論文 |
- "Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects," IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences, vol.E107.A, no.Issue 1, pp96-104, 1 Jan. 2024
- Takuma Nagao, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue, Michihiro Shintani
 [ doi:10.1587/transfun.2023KEP0010 ]
- "Systematic Unsupervised Recycled Field-Programmable Gate Array Detection," IEEE Transactions on Device and Materials Reliability , vol.22, no.2, pp154-163, 4 Apr. 2022
- Yuya Isaka, Michihiro Shintani, Foisal Ahmed, Michiko Inoue
[ doi:10.1109/TDMR.2022.3164788 ]
- "Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation," IEEE Transactions on Power Electronics, vol.37, no.3, pp2970-2982, Mar. 2022
- Michihiro Shintani, Aoi Ueda, Takashi Sato
[ doi:10.1109/TPEL.2021.3118057 ]
- "Evaluation of thermal couple impedance model of power modules for accurate die temperature estimation up to 200 ℃," Japanese Journal of Applied Physics, Feb. 2022
- Yohei Nakamura, Naotaka Kuroda, Ken Nakahara, Michihiro Shintani, Takashi Sato
[ doi:10.35848/1347-4065/ac4b0c ]
- "Unsupervised Recycled FPGA Detection Using Exhaustive Nearest Neighbor Residual Analysis," Japanese Journal of Applied Physics, Feb. 2022
- Yuya Isaka, Michihiro Shintani, Michiko Inoue
[ doi:10.35848/1347-4065/ac5107 ]
- "Efficient Analysis for Mitigation of Workload-dependent Aging Degradation," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Feb. 2022
- Shumpei Morita, Song Bian, Michihiro Shintani, Takashi Sato
[ doi:10.1109/TCAD.2022.3149856 ]
- "Hardware–Software Co-Design for Decimal Multiplication," Computers, vol.10, no.2, pp17, 27 Jan. 2021
- Riaz-ul-haque Mian, Michihiro Shintani, Michiko Inoue
[ doi:10.3390/computers10020017 ]
- "Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol.40, no.8, pp1626-1639, 14 Sep. 2020
- Foisal Ahmed, Michihiro Shintani, Michiko Inoue
[ doi:10.1109/TCAD.2020.3023684 ]
- "Cost-efficient Recycled FPGA Detection through Statistical Performance Characterization Framework," IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol.E103-A, no.9, pp1045-1053, Sep. 2020
- Foisal Ahmed, Michihiro Shintani, Michiko Inoue
 [ NAISTレポジトリ ]
- "Area-Efficient and Reliable Error Correcting Code Circuit Based on Hybrid CMOS/Memristor Circuit," Journal of Electronic Testing: Theory and Applications, vol.36, no.4, pp537-546, Aug. 2020
- Mamoru Ishizaka, Michihiro Shintani, Michiko Inoue
[ doi:10.1007/s10836-020-05892-3 ]
- "Organic Current Mirror PUF for Improved Stability against Device Aging," IEEE Sensors Journal, vol.20, no.4, pp7569-7578, Jul. 2020
- Zhaoxing Qin, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, Takashi Sato
- "Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs," IEEE Transactions on Semiconductor Manufacturing, vol.33, no.2, pp150-158, May. 2020
- Hiroki Tsukamoto, Michihiro Shintani, Takashi Sato
[ doi:10.1109/TSM.2020.2975300 ]
- "Measurement and Modeling of Ambient-air-induced Degradation in Organic Thin-Film Transistor," IEEE Transactions on Semiconductor Manufacturing, vol.33, no.2, pp216-223, May. 2020
- Michihiro Shintani, Michiaki Saito, Kazunori Kuribara, Yasuhiro Ogasahara, Takashi Sato
[ doi:10.1109/TSM.2020.2986609 ]
- "Recovery-aware bias-stress degradation model for organic thin-film transistors considering drain and gate bias voltages," Japanese Journal of Applied Physics, vol.59, no.SG, ppSGGG08, Feb. 2020
- Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, Takashi Sato
[ doi:10.7567/1347-4065/ab6460 ]
- "Feasibility of Low-Power, Low-Voltage Complementary Organic TFT Buskeeper PUF," Japanese Journal of Applied Physics, vol.58, no.SB, ppSBBG03, 21 Jan. 2019
- Yasuhiro Ogasahara, Kazunori Kuribara, Michihiro Shintani, Takashi Sato
- "Surface-Potential-Based Silicon Carbide Power MOSFET Model for Circuit Simulation," IEEE Transactions on Power Electronics, vol.33, no.12, pp10774-10783, Dec. 2018
- Michihiro Shintani, Yohei Nakamura, Kazuki Oishi, Masayuki Hiromoto, Takashi Hikihara, Takashi Sato
- "Modeling of interelectrode parasitic elements of V-groove SiC MOSFET," Nonlinear Theory and Its Applications, IEICE, vol.9, no.3, pp344-357, Jul. 2018
- Rui Zhou, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato
- "Mechanically and Electrically Robust Metal-mask Design for Organic CMOS Circuits," Japanese Journal of Applied Physics, vol.57, no.45, pp04FL05, Feb. 2018
- Michihiro Shintani, Zhaoxing Qin, Kazunori Kuribara, Yasuhiro Ogasahara, Masayuki Hiromoto, Takashi Sato
- "Identification and Application of Invariant Critical Paths under NBTI Degradation," IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol.E100-A, no.12, pp2797-2806, 1 Dec. 2017
- Song Bian, Shumpei Morita, Michihiro Shintani, Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato
- "Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation," IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, vol.E100-A, no.7, pp1464-1472, 1 Jul. 2017
- Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, Takashi Sato
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